The DC side of a solar plant is where energy conversion begins — and where the most
faults originate. Each string is a series chain of modules, making it sensitive to any
single point of current interruption. Detection at this layer relies on comparing
strings against each other and against an irradiance-corrected model, since a single
string's behavior is only meaningful in the context of its peers.
1.01
One or more strings producing zero current despite available irradiance.
In a series string, a single open-circuit failure silences the entire chain. The
symptom is unambiguous — but the root cause (broken connector, blown fuse, damaged module) requires
secondary discrimination.
Observed via
String current = 0
Irradiance > threshold
Peer string comparison
1.02
Unequal current output across strings within the same inverter input — caused by
aging, partial failure, or module-level degradation.
Because strings share a DC bus, a weak string forces the MPPT to a suboptimal
operating point for all. The yield loss compounds: it is not just the weak string underperforming, but
the healthy strings being dragged down.
Observed via
Current imbalance across peers
Statistical spread vs baseline
1.03
Particulate accumulation — dust, sand, pollen, bird droppings — on the module
surface, blocking a fraction of incident irradiance.
Soiling loss is spectrally selective and non-uniform, making it hard to distinguish
from real irradiance reduction. Detection requires a long-horizon Performance Ratio trend separated from
temperature and degradation components.
Observed via
PR trend vs irradiance-corrected model
Pre/post-cleaning comparison
1.04
Obstruction by trees, structures, or cloud edges causing sharp, spatially localized
current dips across one or more strings.
Partial shade on a single cell activates bypass diodes, redirecting current around
the shaded sub-string. This creates a staircase I–V curve with multiple local maxima, causing MPPT
confusion and yield loss larger than the shaded fraction alone.
Observed via
Fast ramp drops
Spatial pattern across strings
Irradiance correlation
1.05
A bypass diode that has failed open (shade impact maximized) or failed closed
(permanent partial short-circuit within the module).
A healthy bypass diode limits shade-induced voltage reversal across sub-strings. An
open failure exposes cells to reverse bias, accelerating hotspot formation. A shorted diode permanently
bypasses sub-strings, creating a fixed power loss invisible to string-level current monitoring alone.
Observed via
V×I inconsistency under shade
Module-level thermal imaging
1.06
Degraded or loose MC4 connectors introducing series resistance, causing intermittent
or thermally-variable power loss.
Connector resistance increases non-linearly with temperature and load current. At
peak irradiance, a faulty connector dissipates more heat, worsening resistance — creating a feedback
loop visible only during high-production hours.
Observed via
Resistive loss signature
Intermittent current drop
Time-of-day correlation
1.07
A break in the string conductor — voltage is present, current is zero.
Physically distinct from a string outage caused by fusing or a module failure: the
voltage floats at Voc while current is entirely absent. The V≠0, I=0 signature is the diagnostic
signature for conductor or terminal failure.
Observed via
V ≠ 0, I = 0
Continuity check
1.08
Unintended low-impedance path to ground or between conductors — Voc collapses,
current behavior becomes abnormal.
Ground faults in large DC arrays can be difficult to localize because current finds
the path of least resistance across the entire field. They represent both yield loss and a safety hazard
under certain failure modes.
Observed via
Voc collapse
Ground fault monitor trigger
Unexpected Isc behavior
1.09
Potential-Induced Degradation — leakage current driven by high system voltage causes
long-term module power loss.
PID disproportionately affects strings at the negative end of a floating system. The
degradation is reversible in early stages via reverse-bias regeneration, making early detection
economically decisive.
Observed via
Gradual PR decline
String Isc drop
Spatial position within array
1.10
Light-Induced Degradation (LID) and Light- and Elevated-Temperature-Induced
Degradation (LETID) — early-life power loss in the first 1–2 years of operation.
LID in Czochralski silicon is driven by boron-oxygen complex formation. LETID
appears across multiple cell technologies and is not fully stabilized within the first year. Both are
often mistaken for underperforming modules or commissioning errors.
Observed via
Early-life PR below model
Distinct signature from long-term PID
Year 1–2 trend
1.11
Localized cell heating caused by current mismatch, cracks, or shading — accelerating
long-term degradation and creating thermal stress.
A cracked or mismatched cell in a sub-string operates in reverse bias when its
string is producing current, dissipating power as heat. Thermal imaging is the gold standard; electrical
signals show output loss versus peer modules.
Observed via
Output loss vs peer panels
Thermal imaging
Long-term trend